Apparatus and method for inspecting liquid crystal display

ABSTRACT

A liquid crystal display (LCD) inspection apparatus and method are provided. The inspection apparatus and method are capable of automatically and accurately detecting defects of an LCD panel, and providing information of the automatically-detected defects of the LCD panel to the operator, thereby enabling the operator to easily recognize the defects.

This application claims the benefit of Korean Patent Application No.10-2005-080043, filed on Aug. 30, 2005, which is hereby incorporated byreference as if fully set forth herein.

BACKGROUND

1. Field of the Invention

The present invention relates to an apparatus that inspects a panel of aliquid crystal display (LCD.

2. Discussion of the Related Art

Generally, LCD inspection apparatuses are adapted to easily inspect,with the naked eye, whether or not an LCD panel is defective.

FIGS. 1 and 2 illustrate a conventional LCD inspection apparatus. Asshown in FIGS. 1 and 2, the conventional LCD inspection apparatusincludes a body 1, an inspection stage 2 which is arranged at one sideof the body 1, to perform an inspection of an LCD panel 10, to beinspected, and a loading/unloading stage 7 which is arranged at theother side of the body 1, to load the LCD panel 10, to be inspected, inthe inspection stage 2, and to unload the inspected LCD panel 10 fromthe inspection stage 2.

As seen in FIG. 2, the LCD inspection apparatus also includes a carrier9 which is mounted to the body 1 such that the carrier 9 is laterallymovable. The carrier transfers the LCD panel 10 from theloading/unloading stage 7 to the inspection stage 2, or from theinspection stage 2 to the loading/unloading stage 7.

The inspection stage 2 includes probe units 3, and a worktable 4 whichbrings the LCD panel 10 into contact with the probe units 3. Theworktable 4 also provides light. The worktable 4 includes a polarizingplate 4 a and a backlight 4 b. A moving stage 5 is arranged at the rearof the worktable 4, to move the worktable 4 such that the worktable 4 isconnected to the probe units 3 in a state of being aligned with theprobe units 3.

A sub table 8 is mounted to the loading/unloading stage 7. The sub table8 functions to incline the LCD panel 10 transferred from a loader (notshown) of the loading/unloading stage 7 by a predetermined angle (forexample, 60°).

A microscope 6 is mounted to the body 1 in front of the inspection stage2 such that the microscope 6 is movable in vertical and lateraldirections. When it is determined, in a macroscopic inspectionoperation, that the LCD panel 10 has defects, the operator can moreprecisely identify the defects of the LCD panel 10, using the microscope6.

An inspection procedure carried out in the above-mentioned conventionalLCD inspection apparatus will now be described.

An LCD panel 10 to be inspected is transferred from the loader (notshown) of the loading/unloading stage 7 to the sub table 8 which, inturn, transfers the LCD panel 10 to the carrier 9 while being inclinedby a predetermined angle. Subsequently, the carrier 9 feeds the LCDpanel 10 to the inspection stage 2. When the LCD panel 10 is placed inthe inspection stage 2, the worktable 4 is moved toward the LCD panel 10in accordance with operation of the moving stage 5. Thereafter, theworktable 4 vacuum-chucks the LCD panel 10 such that the LCD panel 10 ismaintained in a fixed state, and then connects pads (not shown) of thefixed LCD panel 10 to lead pins (not shown) of the probe units 3,respectively.

When electrical connection is achieved between the LCD panel 10 and theprobe units 3, as mentioned above, a predetermined image signal from apattern generator is input to the LCD panel 10 via the probe units 3.The pattern generator, which is an external image signal input unit,sequentially provides various image patterns. When the LCD panel 10 isilluminated by the backlight 4 b, such various image patterns aresequentially displayed on the LCD panel 10. Accordingly, the operatorcan determine whether or not the LCD panel 10 is defective, through thedisplayed patterns.

However, the above-mentioned conventional LCD inspection apparatus hasvarious problems. When an inspection is to be performed of the LCD panel10 using the conventional LCD inspection apparatus, the operator firstperforms a macroscopic inspection with the naked eye, to detect defectspresent on the LCD panel. However, when fine dust D is attached to thesurfaces of upper and lower substrates 11 of the LCD panel 10, as shownin FIG. 3, it is very difficult for the operator to distinguish pointdefects of pixels from the fine dust D.

Thus, even in the case of non-defective products, the LCD panel may bedetermined to be defective. For this reason, there are problems of adegradation in yield and loss of manufacturing costs.

In addition, the time taken for one operator to complete a macroscopicinspection of the LCD panel 10 is increased when the LCD panel has anincreased size.

The conventional LCD inspection apparatus also has a problem in thatdetection of defect information of the LCD panel 10 may be omittedbecause the operator cannot easily identify the defect information.

SUMMARY

The present invention is directed to an apparatus and method forinspecting an LCD that substantially obviate one or more problems due tolimitations and disadvantages of the related art.

A LCD inspection apparatus is provided that comprises an inspector whichphotographs images of various patterns displayed on an LCD panel. Animage processor receives the images photographed by the automaticinspector, extracts defect information from the received images, andconverts the extracted defect information to corresponding data. Apattern generator receives the data from the image processor, sorts thereceived data in terms of patterns, and controls the LCD panel todisplay the sorted data.

In another embodiment of the present invention, a liquid crystal display(LCD) inspection method is provided that comprises a pattern displaystep for displaying images of various patterns on an LCD panel. A defectextraction step is used for extracting information of defects present inthe LCD panel from each of the displayed pattern images. A determinationstep determines a method for displaying the defect information, based ona type of the extracted defect information. A display step displays thedefect information on the LCD panel in accordance with the determineddisplay method.

It is to be understood that both the foregoing general description andthe following detailed description of the present invention areexemplary and explanatory and are intended to provide furtherexplanation of the invention as claimed.

BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying drawings, which are included to provide a furtherunderstanding of the invention and are incorporated in and constitute apart of this application, illustrate embodiment(s) of the invention andtogether with the description serve to explain the principle of theinvention. In the drawings:

FIG. 1 is a front view schematically illustrating a conventional LCDinspection apparatus;

FIG. 2 is a side view of the LCD inspection apparatus shown in FIG. 1;

FIG. 3 is a sectional view of an LCD panel according to the related art,illustrating an example of defects on outer surfaces of the LCD panel;

FIG. 4 is a block diagram schematically illustrating a configuration ofan LCD inspection apparatus according to a first embodiment of thepresent invention;

FIG. 5 is a side view schematically illustrating a structure of anautomatic inspector included in the LCD inspection apparatus accordingto the first embodiment of the present invention;

FIG. 6 is a flow chart illustrating an LCD inspection method using theLCD inspection apparatus according the first embodiment of the presentinvention.

FIG. 7 is a schematic view illustrating an example of display of defectinformation in an LCD panel inspection procedure according to the firstembodiment of the present invention;

FIG. 8 is a schematic view illustrating an LCD inspection apparatusaccording to a second embodiment of the present invention; and

FIG. 9 is a side view schematically illustrating an LCD inspectionapparatus according to a third embodiment of the present invention.

DETAILED DESCRIPTION

Reference will now be made in detail to the preferred embodiments of thepresent invention associated with an LCD inspection apparatus and an LCDinspection method using the same according to the present invention,examples of which are illustrated in the FIGS. 4 to 9. Whereverpossible, the same reference numbers will be used throughout thedrawings to refer to the same or like parts.

FIG. 4 is a block diagram schematically illustrating a configuration ofan LCD inspection apparatus according to a first embodiment of thepresent invention. As shown in FIG. 4, the LCD inspection apparatusaccording to the first embodiment of the present invention mainlyincludes an automatic inspector 100, an image processor 200, and apattern generator 300.

The image processor 200 receives an image produced by the automaticinspector 100, and extracts defect information from the received image.The image processor 200 is configured to convert the extracted defectinformation to corresponding data.

Defect information is information that pertains to substantial defectsin the LCD panel, and includes information of defects of pixels atparticular coordinates, for example, point defects, and information ofdefects of lines at particular coordinates, for example, line defects.

Based on the defect information, the image processor 200 determines adisplay method. The image processor 200 subsequently convertsinformation of the determined display method to correspondingdisplayable data.

The data includes information about the coordinates of the defectinformation, and display data for displaying the coordinate data.

The determined display method is a method for enabling the operator toclearly distinguish the coordinates of defect information from othercoordinates.

The pattern generator 300 receives the coordinate data about defectinformation and the display data for displaying the coordinate data fromthe image processor 200. Based on the received data, the patterngenerator 300 sorts the defect information in terms of patterns, so asto enable the defect information to be displayed on the LCD panel 10when the pattern associated with the defect information is photographed.

The automatic inspector 100 functions to photograph images of variouspatterns displayed on the LCD panel 10. Pattern images are patternswhich are predetermined for an inspection of the LCD panel 10, and aresequentially displayed on the LCD panel 10 in the form of images.

As shown in FIG. 5, the automatic inspector 100 includes a worktable110, probe units 120, a backlight unit 130, a moving stage 140, animaging unit 150, and a pair of polarizing plates 161 and 162.

The worktable 110 has a substantially-square hollow box structure whichis longitudinally open. The LCD panel 10, which is to be inspected, isseated on the front side of the worktable 110. The front side of theworktable 110 faces the imaging unit 150.

The probe units 120 are electrically connected to pads (not shown) ofthe LCD panel 10 seated on the worktable 110. The probe units 120 arearranged around the opening of the worktable 110 at the front side ofthe worktable 110.

A control signal is applied to the LCD panel 10 via the probe units 120.In response to the control signal the LCD panel 10 displays one ofvarious associated pattern images.

The backlight unit 130 is arranged in the worktable 110 to supply lightto the LCD panel 10 seated on the front side of the worktable 110.Preferably, the backlight unit 130 includes a lamp which is either acold fluorescent lamp (CFL), a cold cathode fluorescent lamp (CCFL), anexternal electrode fluorescent lamp (EEFL), or a high-brightness lightemitting diode (LED). It is preferred that the backlight unit 130 beintegrated with the worktable 110.

The moving stage 140 is arranged at the rear of the worktable 110. Themoving stage 140 functions to align the worktable 110 with the probeunits 120, and to connect the worktable 110 to the probe units 120.

The imaging unit 150 is a camera which photographs images of variouspatterns displayed on the LCD panel 10 seated on the front side of theworktable 110. The imaging unit 150 is spaced apart from the front sideof the worktable 110 by a predetermined distance. The imaging unit 150includes a charge coupled device (CCD) camera. More preferably, theimaging unit 150 includes a CCD camera having a resolution equal to orhigher than that of the LCD panel 10.

It may be difficult to photograph the entire region of the LCD panel 10using one imaging unit 150 when it is taken into consideration that therecent trend of LCD panels is to provide an increased size.

In order to see the entire region of the LCD the first embodimentincludes two imaging units 150. The two imaging units 150 are configuredto photograph two divided regions of the LCD panel 10, respectively.

For example, one imaging unit 150 is configured to photograph a portionof the LCD panel 10 positioned at the left side with reference to acenter line of the LCD panel 10, whereas the other imaging unit 150 isconfigured to photograph a portion of the LCD panel 10 positioned at theright side with reference to the center line of the LCD panel 10.

The number of imaging units 150 may be three or more in accordance withthe size of the LCD panel 10, the spacing of the imaging units 150 fromthe LCD panel 10, or the resolution of the imaging units 150.

The first polarizing plate 161, is arranged between the imaging unit 150and the LCD panel 10, to polarize light. On the other hand, the secondpolarizing plate 162 is arranged between the LCD panel 10 and thebacklight unit 130, to polarize light. The first polarizing plate 161 isarranged such that it is adjacent to the imaging unit 150, as comparedto the worktable 110. When the first polarizing plate 161 is arrangedadjacent to the worktable 110, fine dust or foreign matter attached tothe surface of the first polarizing plate 161 may be photographed, andthus, may be recognized as defect information.

It is also preferred that the automatic inspector 100 be shielded froman external illumination environment. If the automatic inspector 100 isinstalled in a space influenced by external illumination light, thelight, which is supplied to the LCD panel 10, may have undesirablecharacteristics due to influences of room illumination light other thanbacklight or influences of a shade formed in accordance with movement ofthe operator.

In the first embodiment of the present invention, the automaticinspector 100 is arranged in a darkroom 20 which is shielded from anexternal illumination environment.

An inspection method for inspecting the LCD panel 10 using theabove-described LCD inspection apparatus according to the firstembodiment of the present invention will now be described with referenceto a flow chart of FIG. 6.

In accordance with the inspection method, the LCD panel 10 is firstloaded in the automatic inspector 100 so that various pattern images,which will be sequentially displayed on the LCD panel 10, can bephotographed. The LCD panel 10 is loaded on the worktable 110 of theautomatic inspector 100, and is then vacuum-chucked such that the LCDpanel 10 is seated on the front side of the worktable 110 (S110).

The LCD panel 10 is subjected to a panel bonding process and asingulation process, to have the form of a unit panel. The LCD panel 10is formed with data shorting pads (not shown) for application ofelectrical signals to a plurality of data lines, and gate shorting pads(not shown) for application of electrical signals to a plurality of gatelines. The data shorting pads and gate shorting pads are formed on afront surface of the LCD panel 10 along the outer peripheral edges ofthe LCD panel 10.

After the LCD panel 10 is seated on the worktable 110, the moving stage140 is driven. In accordance with the driving of the moving stage 140,the worktable 110 is moved forward. As a result, the shorting pads ofthe LCD panel 10 come into contact with respective lead pins (not shown)of the probe units 120, so they are electrically connected (S120).

When a pattern image signal is output from the pattern generator 300under the above-described condition, it is supplied to the LCD panel 10via the probe units 120. At the same time, the backlight unit 130 emitslight, to irradiate backlight to the LCD panel 10. Accordingly, apattern image is displayed on the LCD panel 10. Thus, various patternimages are successively displayed on the LCD panel 10 (S130).

Whenever a pattern image is displayed on the LCD panel 10, the imagingunit 150 photographs the pattern image (S140).

The entire portion of the image displayed on the LCD panel 10 isphotographed by one imaging unit 150. Alternatively, two or more dividedportions of the image may be photographed by one imaging unit 150. Itmay also be possible to photograph two or more divided portions of theimage by two or more imaging units 150, respectively.

The images photographed by the imaging unit 150 are sent to the imageprocessor 200 which extracts defect information from the photographedimages (S150).

The extraction of defect information is achieved by acquiring thecoordinates of different pixel patterns among the photographed images.

For example, extraction of defect information is carried out byacquiring the coordinates of defective pixels generated when a patternfor inspection of dark points is displayed on the LCD panel 10, or thecoordinates of defective pixels generated when a pattern for inspectionof bright points is displayed on the LCD panel 10.

Subsequently, the image processor 200 determines the method fordisplaying the extracted defect information, based on the type of theextracted defect information (S160).

The defect information is classified, in terms of types, intoinformation of defects of pixels at particular coordinates, for example,point defects, and information of defects of lines at particularcoordinates, for example, line defects.

In accordance with one defect information display method, as shown inFIG. 7, boxes B1, B2, B3, and B4 are displayed around the coordinates ofdefects PD1, PD2, PD3, and PD4. Each of the boxes B1, B2, B3, and B4 hasa size enabling the user to identify the associated defect through amacroscopic inspection without using a microscope. Preferably, the boxesB1, B2, B3, and B4 may be displayed in different colors, patterns orline-widths respectively corresponding to different types.

Other display methods may be implemented. For example, defect pixels maybe brightly displayed, as compared to other pixels. In accordance withanother display method, a text may be displayed at the coordinates ofdefects.

After the method for displaying the defect information is determinedbased on the type of the defect information in the above-describedmanner, the image processor 200 converts the information of thedetermined display method to corresponding data. The converted data issent to the pattern generator 300. The converted data may be sent to thepattern generator 300 via a controller (not shown).

When a macroscopic inspection of the LCD panel 10 is carried out by theoperator in accordance with operation of the automatic inspector 100,the defect information is displayed on the LCD panel 10 in accordancewith the display method determined in association with the defectinformation (S170).

For example, for one defective pixel, a box, which is one of the boxesB1, B2, B3, and B4 respectively having different colors (or differentline-widths or different patterns), is displayed around the coordinatesof the defective pixel. For one defective line, a line is preferablydisplayed along the coordinates of the defective line.

The display of defect information may be carried out in various manners.For example, all defect information may be collectively displayed in asingle image in accordance with the display methods respectivelydetermined based on the types of the defect information. Alternatively,in a procedure in which images of different patterns are sequentiallydisplayed on the LCD panel, information of defects having the same typemay be collectively displayed in accordance with the display methoddetermined based on the type of the defect information when the imagehaving the pattern corresponding to the type of the defect informationis displayed. Information of defects, which are grouped into differenttypes, may be selectively or sequentially displayed in the associatedimages displayed on the LCD panel, in accordance with the types of thedefects.

It is preferred that information of all defects PD1, PD2, PD3, and PD4be collectively displayed in a single image in accordance with thedisplay methods respectively determined based on the types of the defectinformation (for example, display of boxes B1, B2, B3, and B4 havingdifferent shapes), in order to enable the operator to more clearlyrecognize respective types of the defects PD1, PD2, PD3, and PD4.

The operator can accurately recognize positions of defective pixels ordefects of the LCD panel in association with each pattern. Based on thedefect information displayed on the LCD panel 10 in accordance with theabove-described successive procedures, the operator determines whetheror not the LCD panel 10 is defective.

The above-described LCD inspection apparatus and method according to thefirst embodiment of the present invention may have a problem in that, ifa plurality of tasks are sequentially performed in one piece ofequipment, the tact time taken for each process is considerablylengthened.

In accordance with a second embodiment of the present invention, an LCDinspection apparatus is provided which includes a macroscopic inspector400 and a carrier 500, in addition to the configuration of the LCDinspection apparatus according to the first embodiment, as shown in FIG.8.

The macroscopic inspector 400 is adapted to enable the operator toinspect each pattern image of the LCD panel with the naked eye. Themacroscopic inspector 400 is connected to the pattern generator 300 sothat data transmission therebetween is possible.

The macroscopic inspector 400 has a configuration substantiallyidentical to that of the automatic inspector 100, except that themacroscopic inspector 400 does not include the imaging unit 150.Preferably, the macroscopic inspector 400 further includes a microscope401, in order to enable the operator to more accurately identifydefective pixels. A microscope 401 may also be included in the automaticinspector 100.

The carrier 500 is adapted to receive the LCD panel 10 from theautomatic inspector 100, and to transfer the received LCD panel 10 tothe macroscopic inspector 400.

Although not shown, a driver is also provided to move the carrier 500.The driver may use a well-known linear driving system. For example, alinear driving system using a ball screw and a servo motor, a lineardriving system using a linear motor, or a linear driving system usingpulleys, a belt, and a motor may be used.

In accordance with the second embodiment of the present invention, theautomatic inspector 100 performs only an automatic inspection, and themacroscopic inspection is carried out using the macroscopic inspector400. Accordingly, it is possible to greatly reduce the tact time.

In When the macroscopic inspector 400 is used, as described above, thepattern generator 300 enables coordinate data about the defectinformation and display data for the coordinate data which is receivedfrom the image processor 200, to be displayed on the LCD panel 10 inassociation with each pattern in the macroscopic inspection carried outby the macroscopic inspector 400.

An inspection method for inspecting the LCD panel 10 using theabove-described LCD inspection apparatus according to the secondembodiment of the present invention will now be described.

In this inspection method, the procedure for photographing each patternimage of the LCD panel 10, the procedure for extracting defectinformation from the photographed images, and the procedure fordetermining the display method for the defect information based on thetype of the defect information are identical to those of the firstembodiment of the present invention.

After an automatic inspection is completed in accordance with theabove-described successive procedures, the moving stage 140 of theautomatic inspector 100 is driven to rearwardly retract the worktable110. As a result, the probe units 120 are disconnected from the LCDpanel 10.

The LCD panel 10 is transferred to the macroscopic inspector 400 by thecarrier 500, and is seated on a front side of a worktable 410 includedin the macroscopic inspector 400. Accordingly, the LCD panel 10 iselectrically connected to probe units 420 included in the macroscopicinspector 400.

When an image of each pattern is displayed in accordance with theoperation of the pattern generator 300, to enable a macroscopicinspection in the macroscopic inspector 400, the defect informationassociated with the pattern is displayed on the LCD panel 10 inaccordance with the display method determined by the image processor200.

Based on the displayed defect information the operator can accuratelyidentify the positions and types of defective pixels

The LCD inspection apparatus according to each of the above-describedembodiments of the present invention may be a problem in that fine dustor foreign matter attached to the surfaces of the polarizing plates 161and 162 or LCD panel 10 may be recognized as defect information.Therefore, it is preferred that information about foreign matter, suchas fine dust, which is included in the image photographed by theautomatic inspector 100 and supplied to the image processor 200, beexcluded from defect information which will be used to identifysubstantial defects of the LCD panel 10.

In accordance with a third embodiment of the present invention, theautomatic inspector 100 further includes illumination units 171 and 172,as shown in FIG. 9.

The illumination units 171 and 172 are arranged between the imaging unit150 and the backlight unit 130. The illumination units 171 and 172supply side light to the LCD panel 10, to enable the operator to moreeasily identify whether or not foreign matter is present on the surfacesof the LCD panel 10.

The illumination units 171 and 172 are arranged along the periphery ofthe LCD panel 10 seated on the worktable 110, in order to emitillumination light toward the surfaces of the LCD panel 10.

A first one of the illumination units 171 and 172 is adapted toirradiate illumination light from the periphery of the LCD panel 10 at aposition forwardly spaced apart from the LCD panel 10 toward a frontsurface of the LCD panel 10. On the other hand, the second illuminationunit 172 is adapted to irradiate illumination light from the peripheryof the LCD panel 10 at a position rearwardly spaced apart from the LCDpanel 10 toward a back surface of the LCD panel 10.

The first illumination unit 171 is arranged between the first polarizingplate 161 and the worktable 110. The second illumination unit 172 isarranged between the second polarizing plate 162 and the worktable 110.Preferably, each of the illumination units 171 and 172 includes a lampwhich is one of a CFL, a CCFL, an EEFL, and a high-brightness LED.

Successive procedures for excluding information about foreign mattersuch as fine dust from defect information using the illumination units171 and 172 will be described in detail. It is preferred that theidentification of foreign matter using the illumination units 171 and172 be carried out before the extraction of defect information of pixelsby the image processor 200. It is more preferred that the identificationof foreign matter using the illumination units 171 and 172 be carriedout by performing a photographing operation for the LCD panel 10 atleast two times before or after each pattern image displayed on the LCDpanel 10 is photographed by the imaging unit 150.

The LCD panel 10 is photographed by the imaging unit 150 in a state inwhich illumination light is irradiated to the front surface and/or backsurface of the LCD panel 10 using the first and second illuminationunits 171 and 172 under the condition in which light emitted from thebacklight unit 130 is shut off. The image photographed in the aboveprocedure does not include images of defective pixels, but includes animage of foreign matter attached to the surfaces of the LCD panel 10 orpolarizing plates 161 and 162.

The photographed image is supplied to the image processor 200. The imageprocessor 200 extracts the coordinates of foreign matter from the imagesupplied to the image processor 200. In a subsequent procedure forextracting the positions of substantial defects of pixels, defectinformation generated at the coordinates identical to the extractedforeign matter coordinates is deleted. Accordingly, only the informationof defective pixels is extracted. As a result, it is possible to achievean accurate defect inspection of the LCD panel.

The LCD panel 10 can minimize the rate of defects generated in a finaltesting procedure carried out after the LCD panel 10 is applied to amodular product (for example, after assembly of the LCD panel 10 to amonitor or TV case) because the LCD panel 10 is completely manufacturedafter the inspection thereof through the above-described inspectionmethod according to each embodiment of the present invention.Accordingly, it is possible to eliminate or minimize assembly of the LCDpanel 10, which has defects, to the modular product, and thus, to reducethe manufacturing costs.

The LCD panel 10, which is completely manufactured after the inspectionthereof through the above-described inspection method according to eachembodiment of the present invention, exhibits a considerably low defectrate, as compared to LCD panels completely manufactured after beinginspected through other inspection methods. Thus, the LCD inspectionapparatus according to the present invention and the inspection methodusing the same are useful in that it is possible to accurately inspectdefects of the LCD panel 10.

It is possible to accurately determine whether or not the LCD panel 10is defective, using the LCD inspection method according to the presentinvention.

As is apparent from the above description, the LCD inspection apparatusand method according to the present invention have various effects.

First, a user may easily and accurately identify the positions ofdefective pixels of an LCD panel in a procedure for inspecting defectsof the LCD panel. Accordingly, it is possible to achieve a reduction ininspection time, an accurate inspection, and an enhancement in yield.

Second, since the LCD inspection apparatus of the present inventionincludes an automatic inspector and a macroscopic inspector in order toseparately perform an automatic defect inspection of the LCD panel and amacroscopic defect inspection of the LCD panel by the operator, there isan effect capable of minimizing the tact time taken for inspection ofthe LCD panel.

Third, since defect information is identified as foreign matter, such asfine dust, attached to the surfaces of the LCD panel, the defectinformation can be excluded from information of substantial pixeldefects, there is an effect capable of achieving a very accurate defectinspection.

Fourth, since the LCD inspection apparatus of the present invention caninclude a plurality of imaging units, an inspection of the entire regionof the LCD panel, irrespective of the size of the LCD panel is possible.

It will be apparent to those skilled in the art that variousmodifications and variations can be made in the present inventionwithout departing from the spirit or scope of the inventions. Thus, itis intended that the present invention covers the modifications andvariations of this invention provided they come within the scope of theappended claims and their equivalents.

1. A liquid crystal display (LCD) inspection method comprising steps of:displaying images of various patterns on an LCD panel; extractinginformation of defects present in the LCD panel from each of thedisplayed pattern images; determining a method for displaying the defectinformation, based on a type of the extracted defect information; anddisplaying the defect information on the LCD panel in accordance withthe determined display method; a foreign matter identification step forphotographing an image of the LCD panel in a state in which illuminationlight is irradiated to a front surface and/or a rear surface of the LCDpanel using first and second illumination units under a condition inwhich light emitted from a backlight unit toward the LCD panel is shutoff, wherein the defect extraction step is executed to delete extractinformation about coordinates of foreign matter from the imagephotographed at the foreign matter identification step, therebyextracting defect information alone.
 2. The LCD inspection methodaccording to claim 1, wherein the type of the defect informationincludes: information of a point defect that is a defect of a pixel atparticular coordinates; and information of a line defect that is adefect of a line at particular coordinates.
 3. The LCD inspection methodaccording to claim 1, wherein the defect information display methodincludes displaying boxes around coordinates of the defects present inthe LCD panel, respectively.
 4. The LCD inspection method according toclaim 3, wherein each of the boxes has a size enabling the box to beidentified.
 5. The LCD inspection method according to claim 3, whereineach of the boxes has a color, a pattern, or a line-width which isdetermined depending on the type of the defect information associatedwith the box.
 6. The LCD inspection method according to claim 3, whereineach of the boxes has a color, a pattern, or a line-width which isdetermined depending on the type of the defect information associatedwith the box.
 7. The LCD inspection method according to claim 1, whereindisplaying the defect information is executed when a macroscopicinspection of the LCD panel is executed.
 8. The LCD inspection methodaccording to claim 1 wherein the determined display method collectivelydisplays information of all defects in accordance with display methodsrespectively determined based on the types of the defect information. 9.The LCD inspection method according to claim 1 wherein the determineddisplay method collectively displays information of defects having thesame type when the image having the pattern corresponding to the type ofthe defect information is displayed.
 10. The LCD inspection methodaccording to claim 1, wherein the determined display method selectivelyor sequentially displays information of defects, which are grouped intodifferent types, in accordance with the types of the defects.
 11. TheLCD inspection method according to claim 1, wherein the defectextraction step includes the steps of: photographing the image displayedin association with each pattern; and supplying the photographed imageto the image processor, and extracting defect information from thesupplied image in the image processor.
 12. The LCD inspection methodaccording to claim 5 wherein the determined display method executed atthe display step is to collectively display information of all defectsin accordance with display methods respectively determined based on thetypes of the defect information.
 13. The LCD inspection method accordingto claim 5 wherein the determined display method executed at the displaystep is to collectively display information of defects having the sametype when the image having the pattern corresponding to the type of thedefect information is displayed.
 14. The LCD inspection method accordingto claim 5 wherein the determined display method executed at the displaystep is to selectively or sequentially display information of defects,which are grouped into different types, in accordance with the types ofthe defects.
 15. The LCD inspection method according to claim 9 furthercomprising: a foreign mailer identification step for photographing animage of the LCD panel in a state in which illumination light isirradiated to a front surface and/or a rear surface of the LCD panelusing first and second illumination units under a condition in whichlight emitted from a backlight unit toward the LCD panel is shut off,wherein the defect extraction step is executed to delete extractinformation about coordinates of foreign matter from the imagephotographed at the foreign matter identification step, therebyextracting defect information alone.